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X-ray reflectivity of multilayer mirrors for the water window

  • H. Grimmer
  • , P. Böni
  • , U. Breitmeier
  • , D. Clemens
  • , M. Horisberger
  • , H. Ch Mertins
  • , F. Schäfers
  • Paul Scherrer Institute
  • Helmholtz-Zentrum Berlin für Materialien und Energie (HZB)

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Multilayer structures for the soft X-ray range were designed as normal incidence mirrors or as linear polarizers at the Brewster angle. Their reflectance was measured with special emphasis on the absorption edges of the multilayer materials. The measurements not only revealed pairs of reflectance peaks at the L edges of Ti, V and Ni, which can be explained by the spin-orbit splitting of the p levels, but also a pair of peaks at the K edge of carbon.

Original languageEnglish
Pages (from-to)73-77
Number of pages5
JournalThin Solid Films
Volume319
Issue number1-2
DOIs
StatePublished - 29 Apr 1998
Externally publishedYes

Keywords

  • Brewster angle
  • Linear polarizers
  • Reflectance peaks

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