Abstract
X-ray ptychographic microscopy combines the advantages of raster scanning X-ray microscopy with the more recently developed techniques of coherent diffraction imaging. It is limited neither by the fabricational challenges associated with X-ray optics nor by the requirements of isolated specimen preparation, and offers in principle wavelength-limited resolution, as well as stable access and solution to the phase problem. In this Review, we discuss the basic principles of X-ray ptychography and summarize the main milestones in the evolution of X-ray ptychographic microscopy and tomography over the past ten years, since its first demonstration with X-rays. We also highlight the potential for applications in the life and materials sciences, and discuss the latest advanced concepts and probable future developments.
| Original language | English |
|---|---|
| Pages (from-to) | 9-17 |
| Number of pages | 9 |
| Journal | Nature Photonics |
| Volume | 12 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2018 |