X-ray magnetic circular dichroism strongly influenced by non-magnetic cover layers

K. Zafar, P. Audehm, G. Schütz, E. Goering, M. Pathak, K. B. Chetry, P. R. Leclair, A. Gupta

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Total electron yield (TEY) is the dominating measurement mode in soft X-ray absorption spectroscopy (XAS), where the sampling depth is generally assumed to be quite small and constant, and the related self-absorption or saturation phenomena are about to be negligible at normal incidence conditions. From the OK edge to CrL2,3 edge XAS ratio we determined a strong change in the effective electron escape length between an uncovered and a RuO2 covered CrO2 sample. This effect has been explained by a simple electron energy filtering model, providing a semi quantitative description. In addition, this simple model can quantitatively describe the unexpected reduced and positive CrL2,3 X-ray magnetic circular dichroism (XMCD) signal of a RuO2/CrO2 bilayer, while previous results have identified a clear negative Cr magnetization at the RuO2/CrO 2 interface. In our case this escape length enhancement has strong impact on the XMCD sum rule results and in general it provides much deeper sampling depth, but also larger self-absorption or saturation effects.

Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume191
DOIs
StatePublished - Dec 2013
Externally publishedYes

Keywords

  • Electron mean free path
  • Half metals
  • Saturation effects
  • Sum rules
  • XMCD

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