Abstract
Total electron yield (TEY) is the dominating measurement mode in soft X-ray absorption spectroscopy (XAS), where the sampling depth is generally assumed to be quite small and constant, and the related self-absorption or saturation phenomena are about to be negligible at normal incidence conditions. From the OK edge to CrL2,3 edge XAS ratio we determined a strong change in the effective electron escape length between an uncovered and a RuO2 covered CrO2 sample. This effect has been explained by a simple electron energy filtering model, providing a semi quantitative description. In addition, this simple model can quantitatively describe the unexpected reduced and positive CrL2,3 X-ray magnetic circular dichroism (XMCD) signal of a RuO2/CrO2 bilayer, while previous results have identified a clear negative Cr magnetization at the RuO2/CrO 2 interface. In our case this escape length enhancement has strong impact on the XMCD sum rule results and in general it provides much deeper sampling depth, but also larger self-absorption or saturation effects.
Original language | English |
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Pages (from-to) | 1-6 |
Number of pages | 6 |
Journal | Journal of Electron Spectroscopy and Related Phenomena |
Volume | 191 |
DOIs | |
State | Published - Dec 2013 |
Externally published | Yes |
Keywords
- Electron mean free path
- Half metals
- Saturation effects
- Sum rules
- XMCD