@inproceedings{9065bb6b3bd440aaa601082059cbb1e4,
title = "X-ray grating interferometry at ESRF: Applications and recent technical developments",
abstract = "We report on the implementation of X-ray grating interferometry at the imaging beamline ID19 of the European Synchrotron Radiation Facility (ESRF). We give a brief overview of the results obtained so far with this instrument and on ongoing developments.",
keywords = "Synchrotron radiation instrumentation, X-ray imaging, X-ray optics, X-ray phase contrast, microtomography",
author = "T. Weitkamp and I. Zanette and G. Schulz and M. Bech and S. Rutishauser and S. Lang and T. Donath and A. Tapfer and H. Deyhle and P. Bernard and Valade, {J. P.} and E. Reznikova and J. Kenntner and J. Mohr and B. M{\"u}ller and F. Pfeiffer and C. David and J. Baruchel",
year = "2010",
doi = "10.1063/1.3625297",
language = "English",
isbn = "9780735409255",
series = "AIP Conference Proceedings",
pages = "28--31",
booktitle = "10th International Conference on X-Ray Microscopy",
note = "10th International Conference on X-Ray Microscopy ; Conference date: 15-08-2010 Through 20-08-2010",
}