X-ray grating interferometry at ESRF: Applications and recent technical developments

T. Weitkamp, I. Zanette, G. Schulz, M. Bech, S. Rutishauser, S. Lang, T. Donath, A. Tapfer, H. Deyhle, P. Bernard, J. P. Valade, E. Reznikova, J. Kenntner, J. Mohr, B. Müller, F. Pfeiffer, C. David, J. Baruchel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We report on the implementation of X-ray grating interferometry at the imaging beamline ID19 of the European Synchrotron Radiation Facility (ESRF). We give a brief overview of the results obtained so far with this instrument and on ongoing developments.

Original languageEnglish
Title of host publication10th International Conference on X-Ray Microscopy
Pages28-31
Number of pages4
DOIs
StatePublished - 2010
Event10th International Conference on X-Ray Microscopy - Chicago, IL, United States
Duration: 15 Aug 201020 Aug 2010

Publication series

NameAIP Conference Proceedings
Volume1365
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference10th International Conference on X-Ray Microscopy
Country/TerritoryUnited States
CityChicago, IL
Period15/08/1020/08/10

Keywords

  • Synchrotron radiation instrumentation
  • X-ray imaging
  • X-ray optics
  • X-ray phase contrast
  • microtomography

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