X-ray diffraction from mesoscopic systems

W. Press; D. Bahr; M. Tolan; B. Burandt; M. Müller; P. Müller-Buschbaum; V. Nitz; J. Stettner

doi:10.1016/0921-4526(94)90123-6

X-ray diffraction from mesoscopic systems

W. Press, D. Bahr, M. Tolan, B. Burandt, M. Müller, P. Müller-Buschbaum, V. Nitz, J. Stettner

Christian-Albrechts-University of Kiel

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi₂ layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse scattering from rough interfaces and diffuse scattering from atomic scale defects. (2) The other example is an investigation of laterally structured surfaces in the region of total external reflection and around Bragg peaks. In both cases extensions of the presently available models the necessary.

Original language	English
Pages (from-to)	42-47
Number of pages	6
Journal	Physica B: Condensed Matter
Volume	198
Issue number	1-3
DOIs	https://doi.org/10.1016/0921-4526(94)90123-6
State	Published - 1 Apr 1994
Externally published	Yes

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10.1016/0921-4526(94)90123-6

Cite this

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title = "X-ray diffraction from mesoscopic systems",

abstract = "Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi2 layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse scattering from rough interfaces and diffuse scattering from atomic scale defects. (2) The other example is an investigation of laterally structured surfaces in the region of total external reflection and around Bragg peaks. In both cases extensions of the presently available models the necessary.",

author = "W. Press and D. Bahr and M. Tolan and B. Burandt and M. M{\"u}ller and P. M{\"u}ller-Buschbaum and V. Nitz and J. Stettner",

note = "Funding Information: This work was supportedb y the Bundesminister-ium ffir Forschungu nd Technologieu ndergrant no. 05401ABI2T. he authorsa lso want to acknowledge the pleasant collaborationa nd discussion with R. Jebasinskia nd S. Mantl (Forschungszen-trum Jfilich), F. Brinkop and J. P. Kotthaus( LMU Miinchen), C. Blessing (Universit/it Hamburg), G. K6nig and L. Briigemann(U niversitfitK iel).",

year = "1994",

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doi = "10.1016/0921-4526(94)90123-6",

language = "English",

volume = "198",

pages = "42--47",

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TY - JOUR

T1 - X-ray diffraction from mesoscopic systems

AU - Press, W.

AU - Bahr, D.

AU - Tolan, M.

AU - Burandt, B.

AU - Müller, M.

AU - Müller-Buschbaum, P.

AU - Nitz, V.

AU - Stettner, J.

N1 - Funding Information: This work was supportedb y the Bundesminister-ium ffir Forschungu nd Technologieu ndergrant no. 05401ABI2T. he authorsa lso want to acknowledge the pleasant collaborationa nd discussion with R. Jebasinskia nd S. Mantl (Forschungszen-trum Jfilich), F. Brinkop and J. P. Kotthaus( LMU Miinchen), C. Blessing (Universit/it Hamburg), G. K6nig and L. Briigemann(U niversitfitK iel).

PY - 1994/4/1

Y1 - 1994/4/1

N2 - Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi2 layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse scattering from rough interfaces and diffuse scattering from atomic scale defects. (2) The other example is an investigation of laterally structured surfaces in the region of total external reflection and around Bragg peaks. In both cases extensions of the presently available models the necessary.

AB - Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi2 layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse scattering from rough interfaces and diffuse scattering from atomic scale defects. (2) The other example is an investigation of laterally structured surfaces in the region of total external reflection and around Bragg peaks. In both cases extensions of the presently available models the necessary.

UR - https://www.scopus.com/pages/publications/0028406996

U2 - 10.1016/0921-4526(94)90123-6

DO - 10.1016/0921-4526(94)90123-6

M3 - Article

AN - SCOPUS:0028406996

SN - 0921-4526

VL - 198

SP - 42

EP - 47

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-3

ER -

X-ray diffraction from mesoscopic systems

Abstract

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