X-ray beam-position monitoring in the sub-micrometre and sub-second regime

Oliver Bunk, Franz Pfeiffer, Marco Stampanoni, Bruce D. Patterson, Clemens Schulze-Briese, Christian David

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

It is demonstrated that X-ray beam positions can be extracted from two-dimensional profiles with sub-pixel resolution. Beam-position measurements utilizing a self-designed low-cost two-dimensional detector have been performed at two synchrotron radiation beamlines of the Swiss Light Source. The effective detector pixel size was 4.8 μm and the resolution achieved for the beam position was about 5 nm. At a data rate of 25 frames per second, periodic variations of the beam position could be detected with a frequency resolution below 0.1 Hz. This allowed, for example, the influence of a turbo-pump in the X-ray optics hutch on the beam position to be quantified, and even minute variations related to the electron beam in the storage ring could be detected.

Original languageEnglish
Pages (from-to)795-799
Number of pages5
JournalJournal of Synchrotron Radiation
Volume12
Issue number6
DOIs
StatePublished - Nov 2005
Externally publishedYes

Keywords

  • Diagnostic tool
  • Sub-pixel resolution
  • X-ray beam position
  • X-ray camera

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