What do matching results of medium area mosfets reveal for large area devices in typical analog applications

Carsten G. Linnenbank; Werner Weber; Ute Kollmer; Birgit Holzapfl; Stephan Sauter; Ulrich Schaper; Ralf Brederlow; Sassan Cyrusian; Sylvia Kessel; Roland Heinrich; Erich Hoefig; Erich Knoblinger; Alfred Hesener; Roland Thewes

What do matching results of medium area mosfets reveal for large area devices in typical analog applications

Carsten G. Linnenbank, Werner Weber, Ute Kollmer, Birgit Holzapfl, Stephan Sauter, Ulrich Schaper, Ralf Brederlow, Sassan Cyrusian, Sylvia Kessel, Roland Heinrich, Erich Hoefig, Erich Knoblinger, Alfred Hesener, Roland Thewes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

12 Scopus citations

Abstract

A method is presented which allows to evaluate the matching behavior of large area MOSFETs. The latter is provided by a specific mathematical averaging technique. It is proven that a simple unique relation is valid over the whole regime. from small to ultra large area devices.

Original language	English
Title of host publication	ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference
Editors	A. Touboul, Y. Danto, H. Grunbacher
Publisher	IEEE Computer Society
Pages	104-107
Number of pages	4
ISBN (Electronic)	2863322346
State	Published - 1998
Externally published	Yes
Event	28th European Solid-State Device Research Conference, ESSDERC 1998 - Bordeaux, France Duration: 8 Sep 1998 → 10 Sep 1998

Publication series

Name	European Solid-State Device Research Conference
ISSN (Print)	1930-8876

Conference

Conference	28th European Solid-State Device Research Conference, ESSDERC 1998
Country/Territory	France
City	Bordeaux
Period	8/09/98 → 10/09/98

Cite this

Linnenbank, C. G., Weber, W., Kollmer, U., Holzapfl, B., Sauter, S., Schaper, U., Brederlow, R., Cyrusian, S., Kessel, S., Heinrich, R., Hoefig, E., Knoblinger, E., Hesener, A., & Thewes, R. (1998). What do matching results of medium area mosfets reveal for large area devices in typical analog applications. In A. Touboul, Y. Danto, & H. Grunbacher (Eds.), ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference (pp. 104-107). Article 1503499 (European Solid-State Device Research Conference). IEEE Computer Society.

Linnenbank, Carsten G. ; Weber, Werner ; Kollmer, Ute et al. / What do matching results of medium area mosfets reveal for large area devices in typical analog applications. ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. editor / A. Touboul ; Y. Danto ; H. Grunbacher. IEEE Computer Society, 1998. pp. 104-107 (European Solid-State Device Research Conference).

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title = "What do matching results of medium area mosfets reveal for large area devices in typical analog applications",

abstract = "A method is presented which allows to evaluate the matching behavior of large area MOSFETs. The latter is provided by a specific mathematical averaging technique. It is proven that a simple unique relation is valid over the whole regime. from small to ultra large area devices.",

author = "Linnenbank, {Carsten G.} and Werner Weber and Ute Kollmer and Birgit Holzapfl and Stephan Sauter and Ulrich Schaper and Ralf Brederlow and Sassan Cyrusian and Sylvia Kessel and Roland Heinrich and Erich Hoefig and Erich Knoblinger and Alfred Hesener and Roland Thewes",

year = "1998",

language = "English",

series = "European Solid-State Device Research Conference",

publisher = "IEEE Computer Society",

pages = "104--107",

editor = "A. Touboul and Y. Danto and H. Grunbacher",

booktitle = "ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference",

note = "28th European Solid-State Device Research Conference, ESSDERC 1998 ; Conference date: 08-09-1998 Through 10-09-1998",

}

Linnenbank, CG, Weber, W, Kollmer, U, Holzapfl, B, Sauter, S, Schaper, U, Brederlow, R, Cyrusian, S, Kessel, S, Heinrich, R, Hoefig, E, Knoblinger, E, Hesener, A & Thewes, R 1998, What do matching results of medium area mosfets reveal for large area devices in typical analog applications. in A Touboul, Y Danto & H Grunbacher (eds), ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference., 1503499, European Solid-State Device Research Conference, IEEE Computer Society, pp. 104-107, 28th European Solid-State Device Research Conference, ESSDERC 1998, Bordeaux, France, 8/09/98.

What do matching results of medium area mosfets reveal for large area devices in typical analog applications. / Linnenbank, Carsten G.; Weber, Werner; Kollmer, Ute et al.
ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. ed. / A. Touboul; Y. Danto; H. Grunbacher. IEEE Computer Society, 1998. p. 104-107 1503499 (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - What do matching results of medium area mosfets reveal for large area devices in typical analog applications

AU - Linnenbank, Carsten G.

AU - Weber, Werner

AU - Kollmer, Ute

AU - Holzapfl, Birgit

AU - Sauter, Stephan

AU - Schaper, Ulrich

AU - Brederlow, Ralf

AU - Cyrusian, Sassan

AU - Kessel, Sylvia

AU - Heinrich, Roland

AU - Hoefig, Erich

AU - Knoblinger, Erich

AU - Hesener, Alfred

AU - Thewes, Roland

PY - 1998

Y1 - 1998

N2 - A method is presented which allows to evaluate the matching behavior of large area MOSFETs. The latter is provided by a specific mathematical averaging technique. It is proven that a simple unique relation is valid over the whole regime. from small to ultra large area devices.

AB - A method is presented which allows to evaluate the matching behavior of large area MOSFETs. The latter is provided by a specific mathematical averaging technique. It is proven that a simple unique relation is valid over the whole regime. from small to ultra large area devices.

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M3 - Conference contribution

AN - SCOPUS:84908214794

T3 - European Solid-State Device Research Conference

SP - 104

EP - 107

BT - ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference

A2 - Touboul, A.

A2 - Danto, Y.

A2 - Grunbacher, H.

PB - IEEE Computer Society

T2 - 28th European Solid-State Device Research Conference, ESSDERC 1998

Y2 - 8 September 1998 through 10 September 1998

ER -

Linnenbank CG, Weber W, Kollmer U, Holzapfl B, Sauter S, Schaper U et al. What do matching results of medium area mosfets reveal for large area devices in typical analog applications. In Touboul A, Danto Y, Grunbacher H, editors, ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. IEEE Computer Society. 1998. p. 104-107. 1503499. (European Solid-State Device Research Conference).

What do matching results of medium area mosfets reveal for large area devices in typical analog applications

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