TY - JOUR
T1 - WAVEGUIDING ANALYSIS OF MUSHROOM STRIPE LASER DIODES.
AU - Amann, Markus Christian
PY - 1988
Y1 - 1988
N2 - The waveguide modes of lambda equals 1. 3 mu m InGaAsP-InP mushroom stripe laser diodes are analyzed rigorously by means of the mode matching technique. The propagation constant and confinement factor of the fundamental TE- and TM-modes are calculated for wide ranges of the relevant laser parameters. Thereby, the cutoff condition for both modes is studied, revealing that for very narrow stripe devices (W less than 1 mu m) first the TE-mode becomes cutoff due to radiation losses of higher order lateral modes is discussed, showing that the maximum stripe width for single lateral mode guiding is higher than for comparable buried heterostructure lasers. Finally, approximate results, as obtained by using the effective refractive index approximation, are compared with the rigorous solutions, showing a satisfactory agreement only for rather large stripe widths far above cutoff.
AB - The waveguide modes of lambda equals 1. 3 mu m InGaAsP-InP mushroom stripe laser diodes are analyzed rigorously by means of the mode matching technique. The propagation constant and confinement factor of the fundamental TE- and TM-modes are calculated for wide ranges of the relevant laser parameters. Thereby, the cutoff condition for both modes is studied, revealing that for very narrow stripe devices (W less than 1 mu m) first the TE-mode becomes cutoff due to radiation losses of higher order lateral modes is discussed, showing that the maximum stripe width for single lateral mode guiding is higher than for comparable buried heterostructure lasers. Finally, approximate results, as obtained by using the effective refractive index approximation, are compared with the rigorous solutions, showing a satisfactory agreement only for rather large stripe widths far above cutoff.
UR - http://www.scopus.com/inward/record.url?scp=0023963299&partnerID=8YFLogxK
U2 - 10.1049/ip-j.1988.0016
DO - 10.1049/ip-j.1988.0016
M3 - Article
AN - SCOPUS:0023963299
SN - 0267-3932
VL - 135
SP - 68
EP - 73
JO - IEE proceedings. Part J, Optoelectronics
JF - IEE proceedings. Part J, Optoelectronics
IS - 1
ER -