Abstract
We use low-temperature microphotoluminescence and photoluminescence excitation spectroscopy to measure the valence band parameters of single wurtzite InGaAs nanoneedles. The effective indium composition is measured by means of polarization-dependent Raman spectroscopy. We find that the heavy-hole and light-hole splitting is ∼95 meV at 10 K and the Stokes shift is in the range of 35-55 meV. These findings provide important insight in the band structure of wurtzite InGaAs that could be used for future bandgap engineering. (Figure Presented).
| Original language | English |
|---|---|
| Pages (from-to) | 11440-11446 |
| Number of pages | 7 |
| Journal | ACS Nano |
| Volume | 8 |
| Issue number | 11 |
| DOIs | |
| State | Published - 25 Nov 2014 |
Keywords
- Band structure
- InGaAs nanoneedle
- Photoluminescence excitation spectroscopy
- Raman spectroscopy
- Wurtzite
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