Upgrading of the ultra-clean injector for depth profiling at the Munich AMS facility

C. Stan-Sion, L. Rohrer, F. Kubo, V. Lazarev, P. Hartung, E. Nolte, R. Behrisch, J. Roth

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

The upgrading of the ultra-clean injector of the accelerator mass spectrometry (AMS) facility was done in order to permit depth profiling of sample materials. The elimination of disturbing crater rim effects was done by using a stepwise movement of the targets in two directions perpendicular to the Cs sputter ion beam. The testing of the facility was done and it was used in depth profiles of deuterium and tritium in vessel wall samples.

Original languageEnglish
Pages (from-to)331-338
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume192
Issue number3
DOIs
StatePublished - May 2002

Keywords

  • Accelerator mass spectrometry
  • Depth profiling
  • Deuterium
  • Tritium

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