Abstract
The upgrading of the ultra-clean injector of the accelerator mass spectrometry (AMS) facility was done in order to permit depth profiling of sample materials. The elimination of disturbing crater rim effects was done by using a stepwise movement of the targets in two directions perpendicular to the Cs sputter ion beam. The testing of the facility was done and it was used in depth profiles of deuterium and tritium in vessel wall samples.
Original language | English |
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Pages (from-to) | 331-338 |
Number of pages | 8 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 192 |
Issue number | 3 |
DOIs | |
State | Published - May 2002 |
Keywords
- Accelerator mass spectrometry
- Depth profiling
- Deuterium
- Tritium