Abstract
The element-specific magnetic structure of an epitaxially grown Mn52Pd48/Fe bilayer showing exchange bias was investigated with atomic-layer depth sensitivity at the antiferromagnet/ferromagnet interface by soft-x-ray magnetic circular dichroism and magnetic reflectivity. A complex magnetic interfacial configuration, consisting of a 2-monolayer-thick induced ferromagnetic region, and pinned uncompensated Mn moments that reach far deeper (∼13), both in the antiferromagnet, were found. For the latter, a direct relationship with the magnitude of the exchange bias is verified by similar measurements perpendicular to the field cooling direction.
| Original language | English |
|---|---|
| Article number | 126402 |
| Journal | Physical Review Letters |
| Volume | 101 |
| Issue number | 12 |
| DOIs | |
| State | Published - 16 Sep 2008 |
| Externally published | Yes |
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