Abstract
We studied the galvanomagnetic carrier transport in magnetic-field-sensitive integrated bipolar transistors by means of exact two-dimensional numerical simulation. The devices considered are dual-collector magnetotransistors as obtained by industrial bipolar IC technology. In contrast to previous work, the complete device structure in its full extension has been modeled. Our simulations clearly demonstrate that in this device type, apart from Lorentz deflection in the collector zone, it is essentially the much disputed emitter injection modulation effect which is decisive for the sensor response.
| Original language | English |
|---|---|
| Pages (from-to) | 210-214 |
| Number of pages | 5 |
| Journal | Sensors and Actuators, A: Physical |
| Volume | 31 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Mar 1992 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Two-dimensional numerical modeling of dual-collector magnetotransistors: Evidence for emitter efficiency modulation'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver