TWO-DIMENSIONAL IMAGING OF HOTSPOTS IN SUPERCONDUCTING TUNNEL JUNCTIONS BY LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY.

R. Gross, M. Koyanagi, H. Seifert, R. P. Huebener

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Hotspots can be generated in superconducting tunnel junctions through dissipation of Joule energy. They can be imaged by scanning the junction surface with the electron beam of an electron scanning microscope equipped with a low temperature stage. It is shown that caused by inhomogeneities of the tunneling barrier the local current density can become very high leading to hotspots at these parts of the junction at relatively low total tunneling current.

Original languageEnglish
Title of host publicationUnknown Host Publication Title
PublisherNorth-Holland
Pages431-432
Number of pages2
Editionpt 1
ISBN (Print)0444869107
StatePublished - 1984
Externally publishedYes

Publication series

Name
Numberpt 1

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