Tutorial (T-3) accelerated testbenches

Wolfgang Ecker; Renate Henftling

doi:10.1109/ICASIC.2003.1277480

Tutorial (T-3) accelerated testbenches

Wolfgang Ecker
, Renate Henftling

Infineon Technologies AG

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Original language	English
Title of host publication	ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings
Editors	Ting-Ao Tang, Wenhong Li, Huihua Yu
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	11
Number of pages	1
ISBN (Electronic)	078037889X
DOIs	https://doi.org/10.1109/ICASIC.2003.1277480
State	Published - 2003
Externally published	Yes
Event	5th International Conference on ASIC, ASICON 2003 - Beijing, China Duration: 21 Oct 2003 → 24 Oct 2003

Publication series

Name	IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
Volume	1
ISSN (Print)	1523-553X

Conference

Conference	5th International Conference on ASIC, ASICON 2003
Country/Territory	China
City	Beijing
Period	21/10/03 → 24/10/03

Access to Document

10.1109/ICASIC.2003.1277480

Cite this

Ecker, W., & Henftling, R. (2003). Tutorial (T-3) accelerated testbenches. In T.-A. Tang, W. Li, & H. Yu (Eds.), ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings (pp. 11). Article 05733667 (IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICASIC.2003.1277480

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title = "Tutorial (T-3) accelerated testbenches",

author = "Wolfgang Ecker and Renate Henftling",

year = "2003",

doi = "10.1109/ICASIC.2003.1277480",

language = "English",

series = "IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "11",

editor = "Ting-Ao Tang and Wenhong Li and Huihua Yu",

booktitle = "ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings",

note = "5th International Conference on ASIC, ASICON 2003 ; Conference date: 21-10-2003 Through 24-10-2003",

}

Ecker, W & Henftling, R 2003, Tutorial (T-3) accelerated testbenches. in T-A Tang, W Li & H Yu (eds), ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings., 05733667, IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 11, 5th International Conference on ASIC, ASICON 2003, Beijing, China, 21/10/03. https://doi.org/10.1109/ICASIC.2003.1277480

Tutorial (T-3) accelerated testbenches. / Ecker, Wolfgang; Henftling, Renate.
ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings. ed. / Ting-Ao Tang; Wenhong Li; Huihua Yu. Institute of Electrical and Electronics Engineers Inc., 2003. p. 11 05733667 (IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Tutorial (T-3) accelerated testbenches

AU - Ecker, Wolfgang

AU - Henftling, Renate

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/33847134543

U2 - 10.1109/ICASIC.2003.1277480

DO - 10.1109/ICASIC.2003.1277480

M3 - Conference contribution

AN - SCOPUS:33847134543

T3 - IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

SP - 11

BT - ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings

A2 - Tang, Ting-Ao

A2 - Li, Wenhong

A2 - Yu, Huihua

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 5th International Conference on ASIC, ASICON 2003

Y2 - 21 October 2003 through 24 October 2003

ER -

Tutorial (T-3) accelerated testbenches

Publication series

Conference

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