Turning Grain Maps into Diagrams

Andreas Alpers, Maximilian Fiedler, Peter Gritzmann, Fabian Klemm

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The present paper studies mathematical models for representing, imaging, and analyzing polycrystalline materials. We introduce various techniques for converting grain maps into diagram or tessellation representations that rely on constrained clustering. In particular, we show how to significantly accelerate the computation of generalized balanced power diagrams and how to extend it to allow for optimization over all relevant parameters. A comparison of the accuracy of the proposed approaches is given based on a three-dimensional real-world data set of 339 × 339 × 599 voxels.

Original languageEnglish
Pages (from-to)223-249
Number of pages27
JournalSIAM Journal on Imaging Sciences
Volume16
Issue number1
DOIs
StatePublished - 2023

Keywords

  • coreset
  • data reduction
  • diagram
  • grain map
  • imaging
  • polycrystal

Fingerprint

Dive into the research topics of 'Turning Grain Maps into Diagrams'. Together they form a unique fingerprint.

Cite this