Transmission electron microscopy on metal-organic frameworks-a review

Christian Wiktor, Maria Meledina, Stuart Turner, Oleg I. Lebedev, Roland A. Fischer

Research output: Contribution to journalReview articlepeer-review

119 Scopus citations

Abstract

Versatile materials like metal-organic frameworks require careful characterization. Transmission electron microscopy is a very powerful method that can address a multitude of investigative challenges. In this review we present TEM studies that yielded valuable insights into the investigated MOFs to illustrate the potential of TEM despite the sensitivity of MOFs to the electron beam.

Original languageEnglish
Pages (from-to)14969-14989
Number of pages21
JournalJournal of Materials Chemistry A
Volume5
Issue number29
DOIs
StatePublished - 2017

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