Towards the integration of carbon nanotubes in microelectronics

  • A. P. Graham
  • , G. S. Duesberg
  • , R. Seidel
  • , M. Liebau
  • , E. Unger
  • , F. Kreupl
  • , W. Hönlein

Research output: Contribution to journalArticlepeer-review

92 Scopus citations

Abstract

The remarkable properties of carbon nanotubes (CNTs) make them especially interesting for microelectronic applications including interconnects and devices. The parallel integration of CNTs into circuits using microelectronics compatible processes is critical for their future application and implies the simultaneous processing of billions of CNTs. We present our concepts for CNT-based interconnects and vertical, surrounding-gate transistors for large-scale integration. In order to realise this, the precise placement of CNTs with lithographic methods and the controlled production of CNTs with defined properties is necessary. We demonstrate vertical interconnects (vias) made from multi-walled nanotubes and their electrical characteristics. Further, we show the CVD growth of single, isolated single-walled and multi-walled CNTs at lithographically defined locations suitable for single CNT devices. Self-aligned, single-walled CNT transistors have also been realised and their electrical performance characterised.

Original languageEnglish
Pages (from-to)1296-1300
Number of pages5
JournalDiamond and Related Materials
Volume13
Issue number4-8
DOIs
StatePublished - Apr 2004
Externally publishedYes

Keywords

  • Chemical vapour deposition
  • Electrical properties
  • Electronic device structures
  • Nanotubes

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