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Towards software quality economics for defect-detection techniques

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

There are various ways to evaluate defect-detection techniques. However, for a comprehensive evaluation the only possibility is to reduce all influencing factors to costs. There are already some models and metrics for the cost of quality that can be used in that context. The existing metrics for the effectiveness and efficiency of defect-detection techniques and experiences with them are combined with cost metrics to allow a more fine-grained estimation of costs and a comprehensive evaluation of defect-detection techniques. The current model is most suitable for directly comparing concrete applications of different techniques.

Original languageEnglish
Title of host publicationProceedings of the 2005 29th Annual IEEE/NASA Software Engineering Workshop, SEW'05
Pages265-274
Number of pages10
DOIs
StatePublished - 2005
Event2005 29th Annual IEEE/NASA Software Engineering Workshop, SEW'05 - Greenbelt, MD, United States
Duration: 6 Apr 20057 Apr 2005

Publication series

NameProceedings of the 2005 29th Annual IEEE/NASA Software Engineering Workshop, SEW'05
Volume2005

Conference

Conference2005 29th Annual IEEE/NASA Software Engineering Workshop, SEW'05
Country/TerritoryUnited States
CityGreenbelt, MD
Period6/04/057/04/05

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