TY - GEN
T1 - Towards Fast Automatic Design of Silicon Dangling Bond Logic
AU - Drewniok, Jan
AU - Walter, Marcel
AU - Walus, Konrad
AU - Wille, Robert
AU - Hang Ng, Samuel Sze
N1 - Publisher Copyright:
© 2025 EDAA.
PY - 2025
Y1 - 2025
N2 - In recent years, Silicon Dangling Bond (SiDB) logic has emerged as a promising beyond-CMOS technology. Unlike conventional circuit technology, where logic is realized through transistors, SiDB logic utilizes quantum dots with variable charge states. By strategically arranging these dots, logic functions can be constructed. However, determining such arrangements is a tremendously complex task. Because of that, the automatic obtainment of SiDB logic implementations is inefficient. To address this challenge, we propose an idea to speed up the design process by utilizing dedicated search space pruning strategies. Initial results show that the combined pruning techniques yield 1) a drastic reduction of the search space, and 2) a corresponding reduction in runtime by up to a factor of 33.
AB - In recent years, Silicon Dangling Bond (SiDB) logic has emerged as a promising beyond-CMOS technology. Unlike conventional circuit technology, where logic is realized through transistors, SiDB logic utilizes quantum dots with variable charge states. By strategically arranging these dots, logic functions can be constructed. However, determining such arrangements is a tremendously complex task. Because of that, the automatic obtainment of SiDB logic implementations is inefficient. To address this challenge, we propose an idea to speed up the design process by utilizing dedicated search space pruning strategies. Initial results show that the combined pruning techniques yield 1) a drastic reduction of the search space, and 2) a corresponding reduction in runtime by up to a factor of 33.
UR - https://www.scopus.com/pages/publications/105006903711
U2 - 10.23919/DATE64628.2025.10992885
DO - 10.23919/DATE64628.2025.10992885
M3 - Conference contribution
AN - SCOPUS:105006903711
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 Design, Automation and Test in Europe Conference, DATE 2025
Y2 - 31 March 2025 through 2 April 2025
ER -