Towards Engineered Safe AI with Modular Concept Models

Lena Heidemann, Iwo Kurzidem, Maureen Monnet, Karsten Roscher, Stephan Günnemann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The inherent complexity and uncertainty of Machine Learning (ML) makes it difficult for ML-based Computer Vision (CV) approaches to become prevalent in safety-critical domains like autonomous driving, despite their high performance. A crucial challenge in these domains is the safety assurance of ML-based systems. To address this, recent safety standardization in the automotive domain has introduced an ML safety lifecycle following an iterative development process. While this approach facilitates safety assurance, its iterative nature requires frequent adaptation and optimization of the ML function, which might include costly retraining of the ML model and is not guaranteed to converge to a safe AI solution. In this paper, we propose a modular ML approach which allows for more efficient and targeted measures to each of the modules and process steps. Each module of the modular concept model represents one visual concept and is aggregated with the other modules' outputs into a task output. The design choices of a modular concept model can be categorized into the selection of the concept modules, the aggregation of their output and the training of the concept modules. Using the example of traffic sign classification, we present each step of the involved design choices and the corresponding targeted measures to take in an iterative development process for engineering safe AI.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
PublisherIEEE Computer Society
Pages3564-3573
Number of pages10
ISBN (Electronic)9798350365474
DOIs
StatePublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

Keywords

  • Computer Vision
  • Concept Models
  • Deep Neural Networks
  • Explainable AI
  • Interpretable Models
  • ML Safety
  • Machine Learning
  • Modular Concept Models
  • Modular Deep Learning
  • Safe AI
  • Safe ML

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