Toward Security Closure in the Face of Reliability Effects

Jens Lienig; Susann Rothe; Matthias Thiele; Nikhil Rangarajan; Mohammed Ashraf; Mohammed Nabeel; Hussam Amrouch; Ozgur Sinanoglu; Johann Knechtel

doi:10.1109/ICCAD51958.2021.9643447

Toward Security Closure in the Face of Reliability Effects

Jens Lienig, Susann Rothe, Matthias Thiele, Nikhil Rangarajan, Mohammed Ashraf, Mohammed Nabeel, Hussam Amrouch, Ozgur Sinanoglu, Johann Knechtel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

The reliable operation of ICs is subject to physical effects like electromigration, thermal and stress migration, negative bias temperature instability, hot-carrier injection, etc. While these effects have been studied thoroughly for IC design, threats of their subtle exploitation are not captured well yet. In this paper, we open up a path for security closure ofphysical layouts in the face of reliability effects. Toward that end, we first review migration effects in interconnects and aging effects in transistors, along with established and emerging means for handling these effects during IC design. Next, we study security threats arising from these effects; in particular, we cover migration effects-based, disruptive Trojans and aging-exacerbated side-channel leakage. Finally, we outline corresponding strategies for security closure of physical layouts, along with an outline for CAD frameworks.

Original language	English
Title of host publication	2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665445078
DOIs	https://doi.org/10.1109/ICCAD51958.2021.9643447
State	Published - 2021
Externally published	Yes
Event	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Munich, Germany Duration: 1 Nov 2021 → 4 Nov 2021

Publication series

Name	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Volume	2021-November
ISSN (Print)	1092-3152

Conference

Conference	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021
Country/Territory	Germany
City	Munich
Period	1/11/21 → 4/11/21

Keywords

Aging
CAD
Electromigration
Hardware Security
Physical Layouts
Side-Channel Attacks
Trojans

Access to Document

10.1109/ICCAD51958.2021.9643447

Cite this

Lienig, J., Rothe, S., Thiele, M., Rangarajan, N., Ashraf, M., Nabeel, M., Amrouch, H., Sinanoglu, O., & Knechtel, J. (2021). Toward Security Closure in the Face of Reliability Effects. In 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; Vol. 2021-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCAD51958.2021.9643447

Lienig, Jens ; Rothe, Susann ; Thiele, Matthias et al. / Toward Security Closure in the Face of Reliability Effects. 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

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title = "Toward Security Closure in the Face of Reliability Effects",

abstract = "The reliable operation of ICs is subject to physical effects like electromigration, thermal and stress migration, negative bias temperature instability, hot-carrier injection, etc. While these effects have been studied thoroughly for IC design, threats of their subtle exploitation are not captured well yet. In this paper, we open up a path for security closure ofphysical layouts in the face of reliability effects. Toward that end, we first review migration effects in interconnects and aging effects in transistors, along with established and emerging means for handling these effects during IC design. Next, we study security threats arising from these effects; in particular, we cover migration effects-based, disruptive Trojans and aging-exacerbated side-channel leakage. Finally, we outline corresponding strategies for security closure of physical layouts, along with an outline for CAD frameworks.",

keywords = "Aging, CAD, Electromigration, Hardware Security, Physical Layouts, Side-Channel Attacks, Trojans",

author = "Jens Lienig and Susann Rothe and Matthias Thiele and Nikhil Rangarajan and Mohammed Ashraf and Mohammed Nabeel and Hussam Amrouch and Ozgur Sinanoglu and Johann Knechtel",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE; 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 ; Conference date: 01-11-2021 Through 04-11-2021",

year = "2021",

doi = "10.1109/ICCAD51958.2021.9643447",

language = "English",

series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",

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Lienig, J, Rothe, S, Thiele, M, Rangarajan, N, Ashraf, M, Nabeel, M, Amrouch, H, Sinanoglu, O & Knechtel, J 2021, Toward Security Closure in the Face of Reliability Effects. in 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, vol. 2021-November, Institute of Electrical and Electronics Engineers Inc., 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021, Munich, Germany, 1/11/21. https://doi.org/10.1109/ICCAD51958.2021.9643447

Toward Security Closure in the Face of Reliability Effects. / Lienig, Jens; Rothe, Susann; Thiele, Matthias et al.
2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; Vol. 2021-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Toward Security Closure in the Face of Reliability Effects

AU - Lienig, Jens

AU - Rothe, Susann

AU - Thiele, Matthias

AU - Rangarajan, Nikhil

AU - Ashraf, Mohammed

AU - Nabeel, Mohammed

AU - Amrouch, Hussam

AU - Sinanoglu, Ozgur

AU - Knechtel, Johann

PY - 2021

Y1 - 2021

N2 - The reliable operation of ICs is subject to physical effects like electromigration, thermal and stress migration, negative bias temperature instability, hot-carrier injection, etc. While these effects have been studied thoroughly for IC design, threats of their subtle exploitation are not captured well yet. In this paper, we open up a path for security closure ofphysical layouts in the face of reliability effects. Toward that end, we first review migration effects in interconnects and aging effects in transistors, along with established and emerging means for handling these effects during IC design. Next, we study security threats arising from these effects; in particular, we cover migration effects-based, disruptive Trojans and aging-exacerbated side-channel leakage. Finally, we outline corresponding strategies for security closure of physical layouts, along with an outline for CAD frameworks.

AB - The reliable operation of ICs is subject to physical effects like electromigration, thermal and stress migration, negative bias temperature instability, hot-carrier injection, etc. While these effects have been studied thoroughly for IC design, threats of their subtle exploitation are not captured well yet. In this paper, we open up a path for security closure ofphysical layouts in the face of reliability effects. Toward that end, we first review migration effects in interconnects and aging effects in transistors, along with established and emerging means for handling these effects during IC design. Next, we study security threats arising from these effects; in particular, we cover migration effects-based, disruptive Trojans and aging-exacerbated side-channel leakage. Finally, we outline corresponding strategies for security closure of physical layouts, along with an outline for CAD frameworks.

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KW - CAD

KW - Electromigration

KW - Hardware Security

KW - Physical Layouts

KW - Side-Channel Attacks

KW - Trojans

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M3 - Conference contribution

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BT - 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

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Y2 - 1 November 2021 through 4 November 2021

ER -

Lienig J, Rothe S, Thiele M, Rangarajan N, Ashraf M, Nabeel M et al. Toward Security Closure in the Face of Reliability Effects. In 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). doi: 10.1109/ICCAD51958.2021.9643447

Toward Security Closure in the Face of Reliability Effects

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Keywords

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