TY - GEN
T1 - Time-domain far-field measurements for cross-correlation analysis
AU - Kuznetsov, Y.
AU - Baev, A.
AU - Haider, M.
AU - Russer, J. A.
AU - Russer, P.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/11
Y1 - 2017/10/11
N2 - In this work the scanned contribution of a pseudo random noise signal generated in a printed circuit board (PCB) is correlated with the radiated electromagnetic interference (EMI) in the near-field as well as in the far-field. Far-field measurements were performed inside the anechoic chamber for the DUT installed on a rotating table. The proposed cross-correlation spatial-time analysis allows to localize the path of the generated pseudorandom source over the PCB surface and to predict the angular distribution of the radiated emissions from the electronic devices.
AB - In this work the scanned contribution of a pseudo random noise signal generated in a printed circuit board (PCB) is correlated with the radiated electromagnetic interference (EMI) in the near-field as well as in the far-field. Far-field measurements were performed inside the anechoic chamber for the DUT installed on a rotating table. The proposed cross-correlation spatial-time analysis allows to localize the path of the generated pseudorandom source over the PCB surface and to predict the angular distribution of the radiated emissions from the electronic devices.
UR - http://www.scopus.com/inward/record.url?scp=85035124585&partnerID=8YFLogxK
U2 - 10.1109/ICEAA.2017.8065571
DO - 10.1109/ICEAA.2017.8065571
M3 - Conference contribution
AN - SCOPUS:85035124585
T3 - Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
SP - 1517
EP - 1520
BT - Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
Y2 - 11 September 2017 through 15 September 2017
ER -