TY - GEN
T1 - Time-domain characterization of probes for two-point measurements of stochastic em fields
AU - Baev, A.
AU - Kuznetsov, Y.
AU - Haider, M.
AU - Russer, J. A.
AU - Russer, P.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/11
Y1 - 2017/10/11
N2 - Due to the internal switching processes high-bit-rate digital devices emit radiated electromagnetic interference (EMI). Scanning of the near-field of the radiated EMI of devices and printed circuit boards (PCBs) with ultra-wideband probes allows to record the EMI field correlations as a basis for modeling the EMI radiated into the environment. Accurate near-field measurements require a de-embedding process that removes the influence of the probes, transmission lines and measurement circuits on the measurement results. In this work we describe a de-embedding methodology based on the measured S-parameters of a test setup consisting of a microstrip test structure and the scanning probe.
AB - Due to the internal switching processes high-bit-rate digital devices emit radiated electromagnetic interference (EMI). Scanning of the near-field of the radiated EMI of devices and printed circuit boards (PCBs) with ultra-wideband probes allows to record the EMI field correlations as a basis for modeling the EMI radiated into the environment. Accurate near-field measurements require a de-embedding process that removes the influence of the probes, transmission lines and measurement circuits on the measurement results. In this work we describe a de-embedding methodology based on the measured S-parameters of a test setup consisting of a microstrip test structure and the scanning probe.
UR - http://www.scopus.com/inward/record.url?scp=85035112680&partnerID=8YFLogxK
U2 - 10.1109/ICEAA.2017.8065572
DO - 10.1109/ICEAA.2017.8065572
M3 - Conference contribution
AN - SCOPUS:85035112680
T3 - Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
SP - 1521
EP - 1524
BT - Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 19th International Conference on Electromagnetics in Advanced Applications, ICEAA 2017
Y2 - 11 September 2017 through 15 September 2017
ER -