Time domain characterization of planar microwave transformers using the SCN-TLM method

Juergen Rebel, Hans Dieter Wohlmuth, Peter Russer

Research output: Contribution to journalArticlepeer-review

Abstract

This paper describes the time domain characterization of planar microwave transformers for monolithic RF power amplifiers using the SCN-TLM method. The primary objective of this study is to determine the influence of losses on the electrical properties of such transformers. It emerges that the principle loss mechanism originates from conductor losses of the windings. The influence of the lossy Silicon substrate can be neglected up to 5 GHz.

Original languageEnglish
Pages (from-to)1109-1112
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
Volume2
DOIs
StatePublished - 2000

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