Abstract
Epitaxial, c-axis oriented Nd1.85Ce0.15CuOx thin films have been fabricated on (100) SrTiO3 substrates by hollow cathode magnetron sputtering. The mixed state of the films has been characterized by measuring the longitudinal resistivity and Nernst effect in magnetic fields up to 6T applied parallel to the c-axis. From the resistivity data an upper critical field slope dHc2/dT = -0.35 T/K was obtained for films with Tc ≅ 22 K corresponding to an ab-plane coherence length ξab = 79 A ̊. From the Nernst effect data the temperature derivative of the transport energy of magnetic flux lines was derived to dUφ/dT = -2.4 × 10-13J/Km. At T = 18 K and H = 0.5 T the transport entropy of magnetic flux lines was obtained to Sφ = 1.6 × 10-14 J/Km. These values are in reasonable agreement with the prediction of time dependent Ginzburg-Landau theory. The measured data are compared to those obtained for epitaxial YBa2Cu3O7-δ and Bi2Sr2CaCu2O8+x thin films.
Original language | English |
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Pages (from-to) | 1367-1368 |
Number of pages | 2 |
Journal | Physica C: Superconductivity and its Applications |
Volume | 235-240 |
Issue number | PART 2 |
DOIs | |
State | Published - Dec 1994 |
Externally published | Yes |