Skip to main navigation Skip to search Skip to main content

Thermal conductivity analysis and device performance of 1.55 μm InGaAlAs/InP buried tunnel junction VCSELs

  • M. Ortsiefer
  • , R. Shau
  • , G. Bühm
  • , F. Kühler
  • , J. Rosskopf
  • , M. C. Amann
  • Walter Schottky Institut

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The thermal resistance of InGaAlAs/InP long-wavelength VCSELs with buried tunnel junctions is investigated by means of a heat flow finite element analysis. Because of the low thermal conductivity of InP based compound layers, a significant improvement is obtained for a top-down mounted structure with a hybrid dielectric-metal back mirror and an InP heat spreading layer. Experimental results for such lasers show cw operation up to 75 °C with a maximum power exceeding 2 mW at room temperature for 17 μm diameter. The temperature behavior of the threshold current indicates a substantial improvement for laser operation at values even far beyond room temperature by adjusting cavity mode and spectral gain.

Original languageEnglish
Pages (from-to)913-919
Number of pages7
JournalPhysica Status Solidi (A) Applied Research
Volume188
Issue number3
DOIs
StatePublished - 2001

Fingerprint

Dive into the research topics of 'Thermal conductivity analysis and device performance of 1.55 μm InGaAlAs/InP buried tunnel junction VCSELs'. Together they form a unique fingerprint.

Cite this