The Scale4Edge RISC-V Ecosystem

Wolfgang Ecker; Peer Adelt; Wolfgang Mueller; Reinhold Heckmann; Milos Krstic; Vladimir Herdt; Rolf Drechsler; Gerhard Angst; Ralf Wimmer; Andreas Mauderer; Rafael Stahl; Karsten Emrich; Daniel Mueller-Gritschneder; Bernd Becker; Philipp Scholl; Eyck Jentzsch; Jan Schlamelcher; Kim Gruttner; Paul Palomero Bernardo; Oliver Bringmann; Mihaela Damian; Julian Oppermann; Andreas Koch; Jorg Bormann; Johannes Partzsch; Christian Mayr; Wolfgang Kunz

doi:10.23919/DATE54114.2022.9774593

The Scale4Edge RISC-V Ecosystem

Wolfgang Ecker, Peer Adelt, Wolfgang Mueller, Reinhold Heckmann, Milos Krstic, Vladimir Herdt, Rolf Drechsler, Gerhard Angst, Ralf Wimmer, Andreas Mauderer, Rafael Stahl, Karsten Emrich, Daniel Mueller-Gritschneder, Bernd Becker, Philipp Scholl, Eyck Jentzsch, Jan Schlamelcher, Kim Gruttner, Paul Palomero Bernardo, Oliver BringmannMihaela Damian, Julian Oppermann, Andreas Koch, Jorg Bormann, Johannes Partzsch, Christian Mayr, Wolfgang Kunz

Chair of Electronic Design Automation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

This paper introduces the project Scale4Edge. The project is focused on enabling an effective RISC-V ecosystem for optimization of edge applications. We describe the basic components of this ecosystem and introduce the envisioned demonstrators, which will be used in their evaluation.

Original language	English
Title of host publication	Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Editors	Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	808-813
Number of pages	6
ISBN (Electronic)	9783981926361
DOIs	https://doi.org/10.23919/DATE54114.2022.9774593
State	Published - 2022
Event	2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 - Virtual, Online, Belgium Duration: 14 Mar 2022 → 23 Mar 2022

Publication series

Name	Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

Conference

Conference	2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Country/Territory	Belgium
City	Virtual, Online
Period	14/03/22 → 23/03/22

Keywords

RISC-V
ecosystem
edge applications

Access to Document

10.23919/DATE54114.2022.9774593

Cite this

Ecker, W., Adelt, P., Mueller, W., Heckmann, R., Krstic, M., Herdt, V., Drechsler, R., Angst, G., Wimmer, R., Mauderer, A., Stahl, R., Emrich, K., Mueller-Gritschneder, D., Becker, B., Scholl, P., Jentzsch, E., Schlamelcher, J., Gruttner, K., Bernardo, P. P., ... Kunz, W. (2022). The Scale4Edge RISC-V Ecosystem. In C. Bolchini, I. Verbauwhede, & I. Vatajelu (Eds.), Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 (pp. 808-813). (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE54114.2022.9774593

Ecker, Wolfgang ; Adelt, Peer ; Mueller, Wolfgang et al. / The Scale4Edge RISC-V Ecosystem. Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. editor / Cristiana Bolchini ; Ingrid Verbauwhede ; Ioana Vatajelu. Institute of Electrical and Electronics Engineers Inc., 2022. pp. 808-813 (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022).

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title = "The Scale4Edge RISC-V Ecosystem",

abstract = "This paper introduces the project Scale4Edge. The project is focused on enabling an effective RISC-V ecosystem for optimization of edge applications. We describe the basic components of this ecosystem and introduce the envisioned demonstrators, which will be used in their evaluation.",

keywords = "RISC-V, ecosystem, edge applications",

author = "Wolfgang Ecker and Peer Adelt and Wolfgang Mueller and Reinhold Heckmann and Milos Krstic and Vladimir Herdt and Rolf Drechsler and Gerhard Angst and Ralf Wimmer and Andreas Mauderer and Rafael Stahl and Karsten Emrich and Daniel Mueller-Gritschneder and Bernd Becker and Philipp Scholl and Eyck Jentzsch and Jan Schlamelcher and Kim Gruttner and Bernardo, {Paul Palomero} and Oliver Bringmann and Mihaela Damian and Julian Oppermann and Andreas Koch and Jorg Bormann and Johannes Partzsch and Christian Mayr and Wolfgang Kunz",

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doi = "10.23919/DATE54114.2022.9774593",

language = "English",

series = "Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Ecker, W, Adelt, P, Mueller, W, Heckmann, R, Krstic, M, Herdt, V, Drechsler, R, Angst, G, Wimmer, R, Mauderer, A, Stahl, R, Emrich, K, Mueller-Gritschneder, D, Becker, B, Scholl, P, Jentzsch, E, Schlamelcher, J, Gruttner, K, Bernardo, PP, Bringmann, O, Damian, M, Oppermann, J, Koch, A, Bormann, J, Partzsch, J, Mayr, C & Kunz, W 2022, The Scale4Edge RISC-V Ecosystem. in C Bolchini, I Verbauwhede & I Vatajelu (eds), Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Institute of Electrical and Electronics Engineers Inc., pp. 808-813, 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Virtual, Online, Belgium, 14/03/22. https://doi.org/10.23919/DATE54114.2022.9774593

The Scale4Edge RISC-V Ecosystem. / Ecker, Wolfgang; Adelt, Peer; Mueller, Wolfgang et al.
Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. ed. / Cristiana Bolchini; Ingrid Verbauwhede; Ioana Vatajelu. Institute of Electrical and Electronics Engineers Inc., 2022. p. 808-813 (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The Scale4Edge RISC-V Ecosystem

AU - Ecker, Wolfgang

AU - Adelt, Peer

AU - Mueller, Wolfgang

AU - Heckmann, Reinhold

AU - Krstic, Milos

AU - Herdt, Vladimir

AU - Drechsler, Rolf

AU - Angst, Gerhard

AU - Wimmer, Ralf

AU - Mauderer, Andreas

AU - Stahl, Rafael

AU - Emrich, Karsten

AU - Mueller-Gritschneder, Daniel

AU - Becker, Bernd

AU - Scholl, Philipp

AU - Jentzsch, Eyck

AU - Schlamelcher, Jan

AU - Gruttner, Kim

AU - Bernardo, Paul Palomero

AU - Bringmann, Oliver

AU - Damian, Mihaela

AU - Oppermann, Julian

AU - Koch, Andreas

AU - Bormann, Jorg

AU - Partzsch, Johannes

AU - Mayr, Christian

AU - Kunz, Wolfgang

PY - 2022

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M3 - Conference contribution

AN - SCOPUS:85130768501

T3 - Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

SP - 808

EP - 813

BT - Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

A2 - Bolchini, Cristiana

A2 - Verbauwhede, Ingrid

A2 - Vatajelu, Ioana

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

Y2 - 14 March 2022 through 23 March 2022

ER -

Ecker W, Adelt P, Mueller W, Heckmann R, Krstic M, Herdt V et al. The Scale4Edge RISC-V Ecosystem. In Bolchini C, Verbauwhede I, Vatajelu I, editors, Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Institute of Electrical and Electronics Engineers Inc. 2022. p. 808-813. (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022). doi: 10.23919/DATE54114.2022.9774593

The Scale4Edge RISC-V Ecosystem

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Keywords

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