The dual-sided effect of project failure on IT professionals

Christoph Pflügler, Manuel Wiesche, Helmut Krcmar

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The effects of project failure on IT professionals have not received much attention in IT research. A failed project evokes negative emotions and therefore could trigger turnover, which has negative influences from the perspective of IT human resource management. However, the failure of IT projects could also have positive influences as professionals might learn from the failed project. This paper focuses on analyzing this dual-sided effect of project failure on IT professionals. We develop hypotheses that will be tested with a large data set from an IT service provider in future research. We expect to contribute to theory by analyzing whether project failure triggers turnover and by analyzing whether IT professionals learn from failed projects and perform better in the future.

Original languageEnglish
Title of host publicationSIGMIS-CPR 2016 - Proceedings of the 2016 ACM SIGMIS Conference on Computers and People Research
PublisherAssociation for Computing Machinery, Inc
Pages33-37
Number of pages5
ISBN (Electronic)9781450342032
DOIs
StatePublished - 2 Jun 2016
EventAnnual ACM SIGMIS Conference on Computers and People Research, SIGMIS CPR 2016 - Alexandria, United States
Duration: 2 Jun 20164 Jun 2016

Publication series

NameSIGMIS-CPR 2016 - Proceedings of the 2016 ACM SIGMIS Conference on Computers and People Research

Conference

ConferenceAnnual ACM SIGMIS Conference on Computers and People Research, SIGMIS CPR 2016
Country/TerritoryUnited States
CityAlexandria
Period2/06/164/06/16

Keywords

  • Learning
  • Project Failure
  • Turnover

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