The 5thWorkshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024)

Matteo Biagiola; Nicolás Cardozo; Foutse Khomh; Vincenzo Riccio; Donghwan Shin; Andrea Stocco

The 5thWorkshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024)

Matteo Biagiola
, Nicolás Cardozo
, Foutse Khomh
, Vincenzo Riccio
, Donghwan Shin
, Andrea Stocco

Informatics 4 - Assistant Professorship of Software Engineering for Data-intensive Applications

University of Lugano
Universidad de Los Andes, Colombia
École Polytechnique de Montréal
Università degli Studi di Udine
University of Sheffield

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	VII
Journal	Proceedings - 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024
State	Published - 12 Jul 2024
Event	2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024 - Lisbon, Portugal Duration: 20 Apr 2024 → 20 Apr 2024

Cite this

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title = "The 5thWorkshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024)",

author = "Matteo Biagiola and Nicol{\'a}s Cardozo and Foutse Khomh and Vincenzo Riccio and Donghwan Shin and Andrea Stocco",

year = "2024",

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journal = "Proceedings - 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024",

note = "2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024 ; Conference date: 20-04-2024 Through 20-04-2024",

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TY - JOUR

T1 - The 5thWorkshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024)

AU - Biagiola, Matteo

AU - Cardozo, Nicolás

AU - Khomh, Foutse

AU - Riccio, Vincenzo

AU - Shin, Donghwan

AU - Stocco, Andrea

PY - 2024/7/12

Y1 - 2024/7/12

UR - https://www.scopus.com/pages/publications/85199927561

M3 - Editorial

AN - SCOPUS:85199927561

SP - VII

JO - Proceedings - 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024

JF - Proceedings - 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024

T2 - 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024

Y2 - 20 April 2024 through 20 April 2024

ER -

The 5thWorkshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024)

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Cite this