Testchip for high temperature superconductor passive devices

R. Dill; J. Otto; G. Riha; P. Russer; L. Schultz; G. Soelkner; A. A. Valenzuela; E. Wolfgang

Testchip for high temperature superconductor passive devices

R. Dill, J. Otto, G. Riha, P. Russer, L. Schultz, G. Soelkner, A. A. Valenzuela, E. Wolfgang

Siemens AG

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been used within the cryo-environment. Quality values obtained at 5 GHz and 77 K are superior to that of an equivalent copper resonator by a factor of about 40.

Original language	English
Pages (from-to)	863-866
Number of pages	4
Journal	IEEE MTT-S International Microwave Symposium Digest
Volume	2
State	Published - 1990
Externally published	Yes
Event	1990 IEEE MTT-S International Microwave Symposium Digest Part 2 (of 3) - Dallas, TX, USA Duration: 8 May 1990 → 10 May 1990

Cite this

@article{c53704e2d9404e9994bac3ac27d22157,

title = "Testchip for high temperature superconductor passive devices",

abstract = "A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been used within the cryo-environment. Quality values obtained at 5 GHz and 77 K are superior to that of an equivalent copper resonator by a factor of about 40.",

author = "R. Dill and J. Otto and G. Riha and P. Russer and L. Schultz and G. Soelkner and Valenzuela, {A. A.} and E. Wolfgang",

year = "1990",

language = "English",

volume = "2",

pages = "863--866",

journal = "IEEE MTT-S International Microwave Symposium Digest",

issn = "0149-645X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "1990 IEEE MTT-S International Microwave Symposium Digest Part 2 (of 3) ; Conference date: 08-05-1990 Through 10-05-1990",

}

TY - JOUR

T1 - Testchip for high temperature superconductor passive devices

AU - Dill, R.

AU - Otto, J.

AU - Riha, G.

AU - Russer, P.

AU - Schultz, L.

AU - Soelkner, G.

AU - Valenzuela, A. A.

AU - Wolfgang, E.

PY - 1990

Y1 - 1990

N2 - A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been used within the cryo-environment. Quality values obtained at 5 GHz and 77 K are superior to that of an equivalent copper resonator by a factor of about 40.

AB - A testchip for fully characterizing high-temperature-superconducting (HTS) thin-film properties relevant to planar passive microwave device applications is presented. The chip integrates coplanar resonators and transmission lines along with structures for process monitoring. Measurements of the quality factor of coplanar resonators as a function of temperature and input power are reported. For the coupling of the resonators to the input signals, microwave probes with 40-GHz bandwidth have been used within the cryo-environment. Quality values obtained at 5 GHz and 77 K are superior to that of an equivalent copper resonator by a factor of about 40.

UR - http://www.scopus.com/inward/record.url?scp=0025023256&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0025023256

SN - 0149-645X

VL - 2

SP - 863

EP - 866

JO - IEEE MTT-S International Microwave Symposium Digest

JF - IEEE MTT-S International Microwave Symposium Digest

T2 - 1990 IEEE MTT-S International Microwave Symposium Digest Part 2 (of 3)

Y2 - 8 May 1990 through 10 May 1990

ER -

Testchip for high temperature superconductor passive devices

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