@inproceedings{8a1ab65e1e0d4065901ae9deff034da6,
title = "Test, Reliability and Functional Safety Trends for Automotive System-on-Chip",
abstract = "This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.",
keywords = "DNNs reliability, Inter-wafer performance variation estimation, SLT-BI automatic test equipment",
author = "F. Angione and D. Appello and J. Aribido and J. Athavale and N. Bellarmino and P. Bernardi and R. Cantoro and \{De Sio\}, C. and T. Foscale and G. Gavarini and J. Guerrero and M. Huch and G. Iaria and T. Kilian and R. Mariani and R. Martone and A. Ruospo and E. Sanchez and U. Schlichtmann and G. Squillero and Reorda, \{M. Sonza\} and L. Sterpone and V. Tancorre and R. Ugioli",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 27th IEEE European Test Symposium, ETS 2022 ; Conference date: 23-05-2022 Through 27-05-2022",
year = "2022",
doi = "10.1109/ETS54262.2022.9810388",
language = "English",
series = "Proceedings of the European Test Workshop",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2022 IEEE European Test Symposium, ETS 2022",
}