Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

F. Angione; D. Appello; J. Aribido; J. Athavale; N. Bellarmino; P. Bernardi; R. Cantoro; C. De Sio; T. Foscale; G. Gavarini; J. Guerrero; M. Huch; G. Iaria; T. Kilian; R. Mariani; R. Martone; A. Ruospo; E. Sanchez; U. Schlichtmann; G. Squillero; M. Sonza Reorda; L. Sterpone; V. Tancorre; R. Ugioli

doi:10.1109/ETS54262.2022.9810388

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, U. Schlichtmann, G. SquilleroM. Sonza Reorda, L. Sterpone, V. Tancorre, R. Ugioli

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.

Original language	English
Title of host publication	Proceedings - 2022 IEEE European Test Symposium, ETS 2022
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665467063
DOIs	https://doi.org/10.1109/ETS54262.2022.9810388
State	Published - 2022
Externally published	Yes
Event	27th IEEE European Test Symposium, ETS 2022 - Barcelona, Spain Duration: 23 May 2022 → 27 May 2022

Publication series

Name	Proceedings of the European Test Workshop
Volume	2022-May
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	27th IEEE European Test Symposium, ETS 2022
Country/Territory	Spain
City	Barcelona
Period	23/05/22 → 27/05/22

Keywords

DNNs reliability
Inter-wafer performance variation estimation
SLT-BI automatic test equipment

Access to Document

10.1109/ETS54262.2022.9810388

Cite this

Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., ... Ugioli, R. (2022). Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In Proceedings - 2022 IEEE European Test Symposium, ETS 2022 (Proceedings of the European Test Workshop; Vol. 2022-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ETS54262.2022.9810388

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title = "Test, Reliability and Functional Safety Trends for Automotive System-on-Chip",

abstract = "This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.",

keywords = "DNNs reliability, Inter-wafer performance variation estimation, SLT-BI automatic test equipment",

author = "F. Angione and D. Appello and J. Aribido and J. Athavale and N. Bellarmino and P. Bernardi and R. Cantoro and {De Sio}, C. and T. Foscale and G. Gavarini and J. Guerrero and M. Huch and G. Iaria and T. Kilian and R. Mariani and R. Martone and A. Ruospo and E. Sanchez and U. Schlichtmann and G. Squillero and Reorda, {M. Sonza} and L. Sterpone and V. Tancorre and R. Ugioli",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 27th IEEE European Test Symposium, ETS 2022 ; Conference date: 23-05-2022 Through 27-05-2022",

year = "2022",

doi = "10.1109/ETS54262.2022.9810388",

language = "English",

series = "Proceedings of the European Test Workshop",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Proceedings - 2022 IEEE European Test Symposium, ETS 2022",

}

Angione, F, Appello, D, Aribido, J, Athavale, J, Bellarmino, N, Bernardi, P, Cantoro, R, De Sio, C, Foscale, T, Gavarini, G, Guerrero, J, Huch, M, Iaria, G, Kilian, T, Mariani, R, Martone, R, Ruospo, A, Sanchez, E, Schlichtmann, U, Squillero, G, Reorda, MS, Sterpone, L, Tancorre, V & Ugioli, R 2022, Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. in Proceedings - 2022 IEEE European Test Symposium, ETS 2022. Proceedings of the European Test Workshop, vol. 2022-May, Institute of Electrical and Electronics Engineers Inc., 27th IEEE European Test Symposium, ETS 2022, Barcelona, Spain, 23/05/22. https://doi.org/10.1109/ETS54262.2022.9810388

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. / Angione, F.; Appello, D.; Aribido, J. et al.
Proceedings - 2022 IEEE European Test Symposium, ETS 2022. Institute of Electrical and Electronics Engineers Inc., 2022. (Proceedings of the European Test Workshop; Vol. 2022-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

AU - Angione, F.

AU - Appello, D.

AU - Aribido, J.

AU - Athavale, J.

AU - Bellarmino, N.

AU - Bernardi, P.

AU - Cantoro, R.

AU - De Sio, C.

AU - Foscale, T.

AU - Gavarini, G.

AU - Guerrero, J.

AU - Huch, M.

AU - Iaria, G.

AU - Kilian, T.

AU - Mariani, R.

AU - Martone, R.

AU - Ruospo, A.

AU - Sanchez, E.

AU - Schlichtmann, U.

AU - Squillero, G.

AU - Reorda, M. Sonza

AU - Sterpone, L.

AU - Tancorre, V.

AU - Ugioli, R.

PY - 2022

Y1 - 2022

N2 - This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.

AB - This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.

KW - DNNs reliability

KW - Inter-wafer performance variation estimation

KW - SLT-BI automatic test equipment

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M3 - Conference contribution

AN - SCOPUS:85134232808

T3 - Proceedings of the European Test Workshop

BT - Proceedings - 2022 IEEE European Test Symposium, ETS 2022

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 27th IEEE European Test Symposium, ETS 2022

Y2 - 23 May 2022 through 27 May 2022

ER -

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

Abstract

Publication series

Conference

Keywords

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