TY - GEN
T1 - Temperature driven memristive switching in Al/TiO2/Al devices
AU - Reiser, D.
AU - Drost, A.
AU - Chryssikos, D.
AU - Eisele, I.
AU - Tornow, M.
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/7
Y1 - 2020/7
N2 - Aluminum/titanium dioxide/aluminum memristor structures were investigated via electrical and temperature-dependent measurements. At room temperature, devices show bipolar memristive switching under applied voltage bias with OFF-ON resistance ratios on the order of 10. Increasing the temperature up to 90 -140°C such a memristor, which has been prepared in the high-resistance state (HRS) before, undergoes a pronounced switching into its low resistance state (LRS). This temperature driven switching is reversible, i.e., it can be reset via application of an appropriate bias voltage sweep, typically up to 1 V. We have further investigated this temperature effect as function of an additionally applied bias and discuss our findings within a proposed atomistic model involving the preferential motion of oxygen vacancies into pre-exposed TiO2regions.
AB - Aluminum/titanium dioxide/aluminum memristor structures were investigated via electrical and temperature-dependent measurements. At room temperature, devices show bipolar memristive switching under applied voltage bias with OFF-ON resistance ratios on the order of 10. Increasing the temperature up to 90 -140°C such a memristor, which has been prepared in the high-resistance state (HRS) before, undergoes a pronounced switching into its low resistance state (LRS). This temperature driven switching is reversible, i.e., it can be reset via application of an appropriate bias voltage sweep, typically up to 1 V. We have further investigated this temperature effect as function of an additionally applied bias and discuss our findings within a proposed atomistic model involving the preferential motion of oxygen vacancies into pre-exposed TiO2regions.
KW - Bipolar memristive switching
KW - Memristor
KW - Resistive random access memory (RRAM)
KW - Sensor
KW - Temperature dependence
UR - http://www.scopus.com/inward/record.url?scp=85091015790&partnerID=8YFLogxK
U2 - 10.1109/NANO47656.2020.9183631
DO - 10.1109/NANO47656.2020.9183631
M3 - Conference contribution
AN - SCOPUS:85091015790
T3 - Proceedings of the IEEE Conference on Nanotechnology
SP - 342
EP - 347
BT - NANO 2020 - 20th IEEE International Conference on Nanotechnology, Proceedings
PB - IEEE Computer Society
T2 - 20th IEEE International Conference on Nanotechnology, NANO 2020
Y2 - 29 July 2020 through 31 July 2020
ER -