Temperature driven memristive switching in Al/TiO2/Al devices

D. Reiser, A. Drost, D. Chryssikos, I. Eisele, M. Tornow

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Aluminum/titanium dioxide/aluminum memristor structures were investigated via electrical and temperature-dependent measurements. At room temperature, devices show bipolar memristive switching under applied voltage bias with OFF-ON resistance ratios on the order of 10. Increasing the temperature up to 90 -140°C such a memristor, which has been prepared in the high-resistance state (HRS) before, undergoes a pronounced switching into its low resistance state (LRS). This temperature driven switching is reversible, i.e., it can be reset via application of an appropriate bias voltage sweep, typically up to 1 V. We have further investigated this temperature effect as function of an additionally applied bias and discuss our findings within a proposed atomistic model involving the preferential motion of oxygen vacancies into pre-exposed TiO2regions.

Original languageEnglish
Title of host publicationNANO 2020 - 20th IEEE International Conference on Nanotechnology, Proceedings
PublisherIEEE Computer Society
Pages342-347
Number of pages6
ISBN (Electronic)9781728182643
DOIs
StatePublished - Jul 2020
Event20th IEEE International Conference on Nanotechnology, NANO 2020 - Virtual, Online, Canada
Duration: 29 Jul 202031 Jul 2020

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2020-July
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference20th IEEE International Conference on Nanotechnology, NANO 2020
Country/TerritoryCanada
CityVirtual, Online
Period29/07/2031/07/20

Keywords

  • Bipolar memristive switching
  • Memristor
  • Resistive random access memory (RRAM)
  • Sensor
  • Temperature dependence

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