Abstract
We have studied the gate and temperature dependence of molecular junctions containing sulfur end-functionallzed tercyclohexylidenes. At low temperatures we find temperature-independent transport; at temperatures above 150 K the current increases exponentially with increasing temperature. Over the entire temperature range (10-300 K), and for different gate voltages, a simple toy model of transport through a single level describes the experimental results. In the model, the temperature dependence arises from the Fermi distribution in the leads and in a three-parameter fit we extract the level position and the tunnel rates at the left and right contact. We find that these parameters increase as the bias voltage increases.
Original language | English |
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Pages (from-to) | 1031-1035 |
Number of pages | 5 |
Journal | Nano Letters |
Volume | 6 |
Issue number | 5 |
DOIs | |
State | Published - May 2006 |
Externally published | Yes |