Temperature dependence of three-terminal molecular junctions with sulfur end-functionalized tercyclohexylidenes

Menno Poot, Edgar Osorio, Kevin O'Neill, Jos M. Thijssen, Daniel Vanmaekelbergh, Cornelis A. Van Walree, Leonardus W. Jenneskens, Herre S.J. Van Der Zant

Research output: Contribution to journalArticlepeer-review

116 Scopus citations

Abstract

We have studied the gate and temperature dependence of molecular junctions containing sulfur end-functionallzed tercyclohexylidenes. At low temperatures we find temperature-independent transport; at temperatures above 150 K the current increases exponentially with increasing temperature. Over the entire temperature range (10-300 K), and for different gate voltages, a simple toy model of transport through a single level describes the experimental results. In the model, the temperature dependence arises from the Fermi distribution in the leads and in a three-parameter fit we extract the level position and the tunnel rates at the left and right contact. We find that these parameters increase as the bias voltage increases.

Original languageEnglish
Pages (from-to)1031-1035
Number of pages5
JournalNano Letters
Volume6
Issue number5
DOIs
StatePublished - May 2006
Externally publishedYes

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