Symmetry properties of short period (001) Si/Ge superlattices

K. Eberl; W. Wegscheider; G. Abstreiter; H. Cerva; H. Oppolzer

doi:10.1016/0749-6036(91)90087-8

Symmetry properties of short period (001) Si/Ge superlattices

K. Eberl, W. Wegscheider, G. Abstreiter, H. Cerva, H. Oppolzer

TUM Emeriti of Excellence

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Depending on the composition of [001] oriented short period Si_mGe_n superlattices (m monolayers Si/n monolayers Ge) there are six different space groups. In case of m+n odd the microscopic periodicity is doubled to 2(m+n) monolayers due to the tetrahedral bonding. We prepared several superlattices namely Si₂Ge₃, Si₃Ge₃ and Si₄Ge₆ with low temperature molecular beam epitaxy. Using selected area diffraction in the transmission electron microscope we found the microscopic periodicity of 10 monolayers for Si₂Ge₃ and Si₄Ge₆. For Si₃Ge₃ the vertical periodicity is six monolayers.

Original language	English
Pages (from-to)	31-33
Number of pages	3
Journal	Superlattices and Microstructures
Volume	9
Issue number	1
DOIs	https://doi.org/10.1016/0749-6036(91)90087-8
State	Published - 1991

Access to Document

10.1016/0749-6036(91)90087-8

Cite this

@article{942c0d9afc164cf98201614ee7efb816,

title = "Symmetry properties of short period (001) Si/Ge superlattices",

abstract = "Depending on the composition of [001] oriented short period SimGen superlattices (m monolayers Si/n monolayers Ge) there are six different space groups. In case of m+n odd the microscopic periodicity is doubled to 2(m+n) monolayers due to the tetrahedral bonding. We prepared several superlattices namely Si2Ge3, Si3Ge3 and Si4Ge6 with low temperature molecular beam epitaxy. Using selected area diffraction in the transmission electron microscope we found the microscopic periodicity of 10 monolayers for Si2Ge3 and Si4Ge6. For Si3Ge3 the vertical periodicity is six monolayers.",

author = "K. Eberl and W. Wegscheider and G. Abstreiter and H. Cerva and H. Oppolzer",

year = "1991",

doi = "10.1016/0749-6036(91)90087-8",

language = "English",

volume = "9",

pages = "31--33",

journal = "Superlattices and Microstructures",

issn = "0749-6036",

publisher = "Academic Press Inc.",

number = "1",

}

TY - JOUR

T1 - Symmetry properties of short period (001) Si/Ge superlattices

AU - Eberl, K.

AU - Wegscheider, W.

AU - Abstreiter, G.

AU - Cerva, H.

AU - Oppolzer, H.

PY - 1991

Y1 - 1991

N2 - Depending on the composition of [001] oriented short period SimGen superlattices (m monolayers Si/n monolayers Ge) there are six different space groups. In case of m+n odd the microscopic periodicity is doubled to 2(m+n) monolayers due to the tetrahedral bonding. We prepared several superlattices namely Si2Ge3, Si3Ge3 and Si4Ge6 with low temperature molecular beam epitaxy. Using selected area diffraction in the transmission electron microscope we found the microscopic periodicity of 10 monolayers for Si2Ge3 and Si4Ge6. For Si3Ge3 the vertical periodicity is six monolayers.

AB - Depending on the composition of [001] oriented short period SimGen superlattices (m monolayers Si/n monolayers Ge) there are six different space groups. In case of m+n odd the microscopic periodicity is doubled to 2(m+n) monolayers due to the tetrahedral bonding. We prepared several superlattices namely Si2Ge3, Si3Ge3 and Si4Ge6 with low temperature molecular beam epitaxy. Using selected area diffraction in the transmission electron microscope we found the microscopic periodicity of 10 monolayers for Si2Ge3 and Si4Ge6. For Si3Ge3 the vertical periodicity is six monolayers.

UR - http://www.scopus.com/inward/record.url?scp=0025824928&partnerID=8YFLogxK

U2 - 10.1016/0749-6036(91)90087-8

DO - 10.1016/0749-6036(91)90087-8

M3 - Article

AN - SCOPUS:0025824928

SN - 0749-6036

VL - 9

SP - 31

EP - 33

JO - Superlattices and Microstructures

JF - Superlattices and Microstructures

IS - 1

ER -

Symmetry properties of short period (001) Si/Ge superlattices

Abstract

Access to Document

Other files and links

Fingerprint

Cite this