TY - GEN
T1 - Switch-Glitch
T2 - 21st Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2024
AU - Probst, Matthias
AU - Gruber, Michael
AU - Brosch, Manuel
AU - Music, Tim
AU - Sigl, Georg
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - While several approaches exist to locate spatial coordinates on a chip that are susceptible to Side-Channel Analysis (SCA), e.g., Test Vector Leakage Assessment (TVLA), so far, an equivalent for localized Electro-Magnetic (EM) based Fault Injection Analysis (FIA) is missing. This work analyzes the spatial relationship between EM emanation and Electro-Magnetic Fault Injection (EMFI) susceptibility and effect. Our experiments are based on a two-step approach where we first capture a heatmap based on a single trace per location, which is then used to find promising spatial EMFI positions. We chose an STM32F303 microcontroller, which shows that the injection locations that result in data modification are almost entirely contained within areas of high Signal-to-Noise Ratio (SNR). An EMFI based attack can be accelerated up significantly using this relationship.
AB - While several approaches exist to locate spatial coordinates on a chip that are susceptible to Side-Channel Analysis (SCA), e.g., Test Vector Leakage Assessment (TVLA), so far, an equivalent for localized Electro-Magnetic (EM) based Fault Injection Analysis (FIA) is missing. This work analyzes the spatial relationship between EM emanation and Electro-Magnetic Fault Injection (EMFI) susceptibility and effect. Our experiments are based on a two-step approach where we first capture a heatmap based on a single trace per location, which is then used to find promising spatial EMFI positions. We chose an STM32F303 microcontroller, which shows that the injection locations that result in data modification are almost entirely contained within areas of high Signal-to-Noise Ratio (SNR). An EMFI based attack can be accelerated up significantly using this relationship.
KW - Fault Injection Analysis
KW - Probe Positioning
KW - Side-Channel Analysis
UR - http://www.scopus.com/inward/record.url?scp=85210896477&partnerID=8YFLogxK
U2 - 10.1109/FDTC64268.2024.00011
DO - 10.1109/FDTC64268.2024.00011
M3 - Conference contribution
AN - SCOPUS:85210896477
T3 - Proceedings - 2024 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2024
SP - 22
EP - 27
BT - Proceedings - 2024 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 4 September 2024
ER -