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Sub-femtosecond free-electron laser pulses

  • W. Helml
  • , A. R. Maier
  • , W. Schweinberger
  • , I. Grguras
  • , P. Radcliffe
  • , G. Doumy
  • , C. Roedig
  • , J. Gagnon
  • , M. Messerschmidt
  • , S. Schorb
  • , C. Bostedt
  • , F. Gruner
  • , L. F. Dimauro
  • , D. Cubaynes
  • , J. D. Bozek
  • , Th Tschentscher
  • , J. T. Costello
  • , M. Meyer
  • , R. Coffee
  • , S. Dusterer
  • A. L. Cavalieri, R. Kienberger
  • Technical University of Munich
  • Max-Planck-Institut für Quantenoptik
  • Center for Free-Electron Laser Science (CFEL)
  • Universität Hamburg
  • Max-Planck Institute for the Structure and Dynamics of Matter
  • European XFEL GmbH
  • Argonne National Laboratory
  • Ohio State University
  • Linac Coherent Light Source
  • Institut des Sciences Moléculaires d'Orsay
  • Dublin City University
  • Deutsches Elektronen-Synchrotron (DESY)

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Deploying the so-called 'Streaking Spectroscopy' technique at LCLS, we demonstrate a non-invasive scheme for temporal characterization of X-ray pulses with sub-femtosecond resolution. Analyzing the substructure indicates pulse durations on the order of hundreds of attoseconds.

Original languageEnglish
Title of host publication2015 Conference on Lasers and Electro-Optics, CLEO 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781557529688
StatePublished - 10 Aug 2015
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: 10 May 201515 May 2015

Publication series

NameConference on Lasers and Electro-Optics Europe - Technical Digest
Volume2015-August

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2015
Country/TerritoryUnited States
CitySan Jose
Period10/05/1515/05/15

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