Studies of the residual absorption of HTSC at submillimeter wavelengths by means of photothermal interference spectroscopy

Harry S. Barowski, Armin Arnold, R. Eder, Martin Prenninger, A. Vogenauer, Evgeny V. Pechen, Karl F. Renk, Werner Prusseit, Helmut Kinder, Robert G. Buckley, Donald M. Pooke, Kohji Kishio

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The determination of the residual, low temperature absorption of high temperature superconductors is of interest for applications of this new material at submillimeter wavelengths and of basic interest. The photothermal interference spectroscopy allows us to measure the residual, low temperature absorption of a HTSC. For the determination of the residual absorption of a superconductor a far-infrared beam is periodically modulated and focused on the sample. Absorption leads to a periodic change of the temperature of the sample surface and, due to heat diffusion, also in the gas volume adjacent to the sample. This temperature change in the gas is detected via the refractive index change using a two beam interferometer. We studied the residual losses of YBaCuO thin films on various substrates and of BiSrCaCuO (2212) single crystals at submillimeter wavelengths. We find that the frequency dependence of the absorptivity, which shows a frequency squared behavior at microwave frequencies, is less than quadratic at THz-frequencies. The YBaCuO thin films show a plateau between 0.6 THz and 4 THz with an absolute value of the absorptivity of about 10 -2. A BiSrCaCuO single crystal shows a plateau between 1 THz and 4 THz with an absorptivity in the order of 10 -3.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsI. Bozovic, D. van der Marel
Pages66-77
Number of pages12
Edition1/-
StatePublished - 1996
Externally publishedYes
EventSpectroscopic Studies of Superconductors. Part 2 (of 2) - San Jose, CA, USA
Duration: 29 Jan 19961 Feb 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Number1/-
Volume2696

Conference

ConferenceSpectroscopic Studies of Superconductors. Part 2 (of 2)
CitySan Jose, CA, USA
Period29/01/961/02/96

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