Struktur-Untersuchung überkonsolidierter Tone mit dem Raster-Kraftmikroskop (AFM)

Translated title of the contribution: Texture of overconsolidated clays with the Atomic Force Microscope AFM

Peter Schick, Andre Kempe, Oliver Wedderer, Wolfgang Heckl

Research output: Contribution to specialist publicationArticle

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Engineering