@inproceedings{aa2223aa3f3d4acb81b7bcf444e11398,
title = "Structured Design and Evaluation of a Resistor-Based PUF Robust Against PVT-Variations",
abstract = "This paper proposes a new fully CMOS-compatible PUF primitive robust against process variations, supply voltage variations and temperature drift (PVT) based on resistive structures that implements advanced compensation mechanisms already on circuit level. Based on analog simulation data, the PUF is evaluated regarding its unpredictability and its reliability. The results indicate a high quality. Further, a structured approach for designing a suitable error correction is presented to illustrate the whole PUF system.",
keywords = "Silicon PUF, error orrection, mixed signal",
author = "Carl Riehm and Christoph Frisch and Florin Burcea and Matthias Hiller and Michael Pehl and Ralf Brederlow",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023 ; Conference date: 03-05-2023 Through 05-05-2023",
year = "2023",
doi = "10.1109/DDECS57882.2023.10139352",
language = "English",
series = "Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "93--98",
editor = "Maksim Jenihhin and Hana Kubatova and Nele Metens and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek",
booktitle = "Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023",
}