Abstract
Ce/Fe and Ce/FeCoV multilayers have been grown by magnetron sputtering on Si substrates with layer thicknesses in the range 10-40 Å. The influence of the sputtering conditions and design of the multilayers on the crystallinity of the layers and on the quality of the interfaces has been studied by X-ray diffraction and reflection. The interfaces are well defined and the layers are crystalline down to an individual layer thickness of 20 Å. Ce/FeCoV multilayers show sharper interfaces than Ce/Fe ones but some loss of crystallinity is observed. Hysteresis loops obtained by SQUID show different behaviour of the bulk magnetisation as a function of the layer thickness. Fe moments are found by Mössbauer spectroscopy to be perpendicular to the interfaces for small periodicity multilayers.
| Original language | English |
|---|---|
| Pages (from-to) | 473-474 |
| Number of pages | 2 |
| Journal | Physica B: Condensed Matter |
| Volume | 234-236 |
| DOIs | |
| State | Published - 2 Jun 1997 |
| Externally published | Yes |
Keywords
- Interfaces
- Multilayers
- Rare-earth metals
- Reflectometry
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