Abstract
The microstructure and lattice parameters of coherently strained epitaxial La2/3Sr1/3MnO3 and La2/3Ba1/3MnO3 thin films and La2/3Ba1/3MnO3/SrTiO3 heterostructures were investigated. The structure of the films and heterostructures was analyzed using a four-circle X-ray diffractometer and high-resolution transmission electron microscopy. Strain played a significant role due to the large lattice mismatch.
| Original language | English |
|---|---|
| Pages (from-to) | 3636-3638 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 74 |
| Issue number | 24 |
| DOIs | |
| State | Published - 14 Jun 1999 |
| Externally published | Yes |
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