Abstract
The microstructure and lattice parameters of coherently strained epitaxial La2/3Sr1/3MnO3 and La2/3Ba1/3MnO3 thin films and La2/3Ba1/3MnO3/SrTiO3 heterostructures were investigated. The structure of the films and heterostructures was analyzed using a four-circle X-ray diffractometer and high-resolution transmission electron microscopy. Strain played a significant role due to the large lattice mismatch.
Original language | English |
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Pages (from-to) | 3636-3638 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 74 |
Issue number | 24 |
DOIs | |
State | Published - 14 Jun 1999 |
Externally published | Yes |