(S)TEM tomography of AlAs-GaAs coaxial nanowires

Josep M. Rebled, Sònia Conesa-Boj, Jordi Arbiol, Francesca Peiró, Joan R. Morante, Matthias Heigoldt, Danĉe Spirkoska, Gerhard Abstreiter, Anna Fontcuberta I. Morral

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

TEM tomography is used as a complementary tool to characterize AlAs-GaAs coaxial nanowires. These nanostructures have been grown on two different GaAs substrate orientations using molecular-beam epitaxy (MBE). The results show that quantum wells synthesized on nanowires grown on different substrate orientations present different morphology, which induces changes on their photoluminescence properties.

Original languageEnglish
Title of host publicationProceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
Pages65-68
Number of pages4
DOIs
StatePublished - 2009
Event2009 Spanish Conference on Electron Devices, CDE'09 - Santiago de Compostela, Spain
Duration: 11 Feb 200913 Feb 2009

Publication series

NameProceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

Conference

Conference2009 Spanish Conference on Electron Devices, CDE'09
Country/TerritorySpain
CitySantiago de Compostela
Period11/02/0913/02/09

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