Stable, freestanding Ge nanocrystals

  • I. D. Sharp
  • , Q. Xu
  • , C. Y. Liao
  • , D. O. Yi
  • , J. W. Beeman
  • , Z. Liliental-Weber
  • , K. M. Yu
  • , D. N. Zakharov
  • , J. W. Ager
  • , D. C. Chrzan
  • , E. E. Haller

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

Freestanding Ge nanocrystals that are stable under ambient conditions have been synthesized in a two-step process. First, nanocrystals with a mean diameter of 5 nm are grown in amorphous Si O2 by ion implantation followed by thermal annealing. The oxide matrix is then removed by selective etching in diluted HF to obtain freestanding nanocrystals on a Si wafer. After etching, nanocrystals are retained on the surface and the size distribution is not significantly altered. Freestanding nanocrystals are stable under ambient atmospheric conditions, suggesting formation of a self-limiting native oxide layer. For freestanding as opposed to embedded Ge nanocrystals, an additional amorphouslike contribution to the Raman spectrum is observed and is assigned to surface reconstruction-induced disordering of near-surface atoms.

Original languageEnglish
Article number124316
JournalJournal of Applied Physics
Volume97
Issue number12
DOIs
StatePublished - 2005

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