Stability of Charge Centers in Solid Ar

E. V. Savchenko, O. N. Grigorashchenko, A. N. Ogurtsov, V. V. Rudenkov, G. B. Gumenchuk, M. Lorenz, A. Lammers, V. E. Bondybey

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

The technique of thermally stimulated exoelectron emission (TSEE) was used for the first time for a study of thermal stability of charged centers in solid Ar. The data obtained demonstrate the efficiency of combining the TSEE study with thermally stimulated luminescence (TSL) for trap-level analysis. High thermal stability of charge centers at low temperatures was found.

Original languageEnglish
Pages (from-to)379-387
Number of pages9
JournalJournal of Low Temperature Physics
Volume122
Issue number3-4
DOIs
StatePublished - 2001

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