Spin-dependent electronic noise

M. S. Brandt, S. T.B. Goennenwein, M. Stutzmann

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The influence of electron spin resonance on generation-recombination noise is studied. In nin-photoconductors made from amorphous hydrogenated silicon (a-Si:H), a resonant decrease of the noise power density is observed. Both the sign of the noise-detected magnetic resonance (NDMR) signal as well as the frequency dependence of the signal amplitude can be described by a resonant reduction of the characteristic generation-recombination time constant. The g-factor observed identifies hopping in the valence band as the dominant spin-dependent transport process leading to electronic noise in this material.

Original languageEnglish
Pages (from-to)67-70
Number of pages4
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume10
Issue number1-3
DOIs
StatePublished - May 2001

Keywords

  • Electron spin resonance
  • Electronic noise
  • Noise-detected magnetic resonance
  • Spin-dependent tunneling

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