Abstract
The influence of electron spin resonance on generation-recombination noise is studied. In nin-photoconductors made from amorphous hydrogenated silicon (a-Si:H), a resonant decrease of the noise power density is observed. Both the sign of the noise-detected magnetic resonance (NDMR) signal as well as the frequency dependence of the signal amplitude can be described by a resonant reduction of the characteristic generation-recombination time constant. The g-factor observed identifies hopping in the valence band as the dominant spin-dependent transport process leading to electronic noise in this material.
Original language | English |
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Pages (from-to) | 67-70 |
Number of pages | 4 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 10 |
Issue number | 1-3 |
DOIs | |
State | Published - May 2001 |
Keywords
- Electron spin resonance
- Electronic noise
- Noise-detected magnetic resonance
- Spin-dependent tunneling