Special section reliability and variability of devices for circuits and systems

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	1057
Number of pages	1
Journal	Microelectronics Reliability
Volume	54
Issue number	6-7
DOIs	https://doi.org/10.1016/j.microrel.2014.03.010
State	Published - 2014

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@article{30b00fa17de448a3b4a8e421f343546f,

title = "Special section reliability and variability of devices for circuits and systems",

author = "Asen Asenov and Ulf Schlichtmann and Tan, \{Cher Ming\} and Hei Wong and Xing Zhou",

year = "2014",

doi = "10.1016/j.microrel.2014.03.010",

language = "English",

volume = "54",

pages = "1057",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd.",

number = "6-7",

}

TY - JOUR

T1 - Special section reliability and variability of devices for circuits and systems

AU - Asenov, Asen

AU - Schlichtmann, Ulf

AU - Tan, Cher Ming

AU - Wong, Hei

AU - Zhou, Xing

PY - 2014

Y1 - 2014

UR - https://www.scopus.com/pages/publications/84901617758

U2 - 10.1016/j.microrel.2014.03.010

DO - 10.1016/j.microrel.2014.03.010

M3 - Editorial

AN - SCOPUS:84901617758

SN - 0026-2714

VL - 54

SP - 1057

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 6-7

ER -