Abstract
We have developed and applied a method to measure the surface resistance of HTS films spatially resolved. To avoid high characterizing frequencies and to get an enhanced frequency stability we used a special parallel-plate resonator design. The system uses a stationary dielectric puck system and moves the HTS thin film sample over the open resonator, sampling the surface resistance at a frequency of 10.5 GHz. The spatial resolution of the prototype system is 9 mm. An adjustable coupling allows to measure the surface resistance in-situ as a function of the strength of the microwave magnetic field. We describe measurements of the spatial variation of linear and non-linear effects in the surface resistance of YBa2Cu3O7 films at 77K.
| Original language | English |
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| Pages | 16 |
| Number of pages | 1 |
| State | Published - 2000 |
| Event | 12 Asia-Pacific Microwave Conference - Sydney, Australia Duration: 3 Dec 2000 → 6 Dec 2000 |
Conference
| Conference | 12 Asia-Pacific Microwave Conference |
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| City | Sydney, Australia |
| Period | 3/12/00 → 6/12/00 |