Abstract
The spatial variation of the resistive transition and critical current density jc in Y1Ba2Cu3O7 films, grown on single crystalline and polycrystalline SrTiO3, has been imaged by low temperature scanning electron microscopy (LTSEM) with a spatial resolution of about 1 mu m. In polycrystalline samples the limitation of jc due to the weak link behavior of the grain boundary network has been directly imaged. The studies on epitaxial YBCO films with jc (77 K) above 106 A/cm2 reveal temperature variations in the local resistive transition curves up to 200 mK. Possible mechanisms for the observed spatial variations are discussed.
Original language | English |
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Article number | 024 |
Pages (from-to) | S115-S117 |
Journal | Superconductor Science and Technology |
Volume | 4 |
Issue number | 1 S |
DOIs | |
State | Published - 1991 |
Externally published | Yes |